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These Articles are a mixture
of ESD subjects:
Buying
and Selling Static Control-
1990: by Randy Ford. "Procuring
static-control products can be a little less confusing if you know
"who's on first."
Evaluating
ESD Smocks- 1992:
Gary L. Johnson, Dan D. Steffe. "An effective smock depends
not only on the fabric used to make it, but also on how the smock
is designed and cleaned."
What
does it Mean to Certify?-
1990: by Greg Bosch. "Often in the ESD packaging business,
we are asked to "certify" to a customer's specification.
This requirement that a manufacturer's product meet a user's specification
is typical in the electronics industry. If fact, as manufacturer's
of ESD packaging, we often require certification from our own vendors."
ESD
For Managers-
1988: by Glenn William Bodison. "Putting an ESD program on
a manager's action list makes his or her life easier."
Developing
ESD-Immune Electronic Systems-
1993: by Michael J. Smith. "Here is how two different systems
were affected by ESD and how they were designed to be ESD-immune."
Going
Beyond Surface Resistivity-
1990: by Stephen Fowler. "Depending on the material, surface
resistivity may be a misleading indicator of static-control capabilities."
From
MIL-P-81705 (AS) to MIL-B-81705C-
1989: by Charles R. Hynes. " Over the past twenty years, MIL-P-81705
has helped shape static-control products and methodologies. Here's
how this key military specification has grown and changed with time."
Part
II: From MIL-P-81705 (AS) to MIL-B-81705C-
1990: by Charles R. Hynes. "Over the past twenty years, MIL-B-81705
has helped shape static-control products and methods. Here's part
two of the story of how this key military specification was itself
shaped and grew."
The
ESD Threat to PCB-Mounted ICs-
1991 by: Warren Boxleitner. "Charged boards and personnel can
create serious ESD problems for ICs mounted on printed circuit boards."
Clean
Corona Ionization- 1992
by: Kenneth D. Murray and Vaughn P. Gross answer the question "Can
clean ionization be achieved by using air or nitrogen to minimize
particle buildup on emitter points?"
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